Custom-built setup to measure Seebeck coefficient and sheet resistance of thin-film samples.
– The sheet resistance is determined using the van der Pauw method, by measuring all permutations of 4-point resistances between the sample corners.
– The Seebeck coefficient is obtained by heating one side of the sample and fitting the slope of the measured thermovoltage versus the applied temperature difference.
– Resistances and thermovoltage are measured using the copper strands of the four T type thermocouples, while the local temperatures are measured using the copper and constantan strands of each individual thermocouple.
– If the sample thickness is known, the thermoelectric power factor S² σ can be calculated.
– Data is acquired using a Keithley 2400 SourceMeter that is controlled via GPIB by a Raspberry Pi single-board computer.
Lab: Optical Lab
Contact: Bernhard Dörling (firstname.lastname@example.org)